No Label Left Behind: A Unified Surface Defect Detection Model for all Supervision Regimes
Paper • 2508.19060 • Published • 12
Weights for MVTec AD unsupervised mode.
- Code: https://github.com/blaz-r/SuperSimpleNet
- Paper (JIMS): https://link.springer.com/article/10.1007/s10845-025-02680-8
- Paper (Arxiv): https://arxiv.org/abs/2508.19060
- Docs: https://github.com/blaz-r/SuperSimpleNet
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